<img height="1" width="1" style="display:none;" alt="" src="https://dc.ads.linkedin.com/collect/?pid=305105&amp;fmt=gif">

Wineman Technology Releases Part 1 of Video Series: Increasing the Value of Your Test System Investment

Posted by admin on March 5, 2012

The first of three videos in a series titled, “Increasing the Value of Your Test System Investment,” is now available on Wineman Technology’s YouTube channel. The videos are from a live keynote presentation at Wineman Technology’s open house event, hosted on September 22, 2011, in Saginaw, MI. Keynote speaker, Chris Washington, Senior Product Manager for Real-Time Testing and HIL Simulation at National Instruments (NI), discusses the growing trends and latest technology used for system testing.

Part One in the series is titled, “Growth of Embedded Software & HIL Testing.” This is a 10-minute presentation clip, where Chris examines the growth of complex systems and how test applications used to validate these systems must evolve to keep pace.

Parts Two and Three continue on the theme of latest trends and technology for system testing by highlighting the applications and features of Wineman Technology products: INERTIA™ and Dynacar. Parts Two and Three will soon be available on our YouTube channel.

Keynote speaker, Chris Washington received his Bachelor of Science degree in Electrical Engineering from Texas A&M University with a focus on digital electronics and control systems. During his tenure at NI, Washington has provided consulting and support services for various applications, including hardware-in-the-loop testing, rapid control prototyping, noise-vibration-harshness testing, in-vehicle data logging, and real-time test cell development. Additionally, Washington has worked as an applications engineer and a LabVIEW instructor.

"Increasing the Value of Your Test System Investment" Video Series:
Video Series Part 1: Growth of Embedded Software & HIL Testing
Video Series Part 2: Leveraging HIL Models to Improve Physical Testing
Video Series Part 3: Technologies for Real-Time Testing

Topics: Events