National Instruments Technical Symposiums (NITS) 2011 Highlights

December 15th, 2011   admin  

Wineman Technology has completed its whirlwind tour of NITS in Detroit, Edison, Phoenix, Knoxville, and Denver, ending on the second week of December. Thank you to everyone who stopped by and visited our booth.We enjoyed sharing our new test products, INERTIA™ and Dynacar, and talking with each of you about your testing needs.

Some of the top technical sessions at NITS 2011 included:

  • Hardware-in-the-loop (HIL) and real-time testing techniques – featuring our INERTIA test automation software
  • The latest features in NI LabVIEW 2011 and best practices for software development
  • Techniques for RF vector signal analyzers
  • Optimization of DC measurements for speed and stability

For additional resources about our automated test, data acquisition, and real-time control solutions:

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2 Responses to “National Instruments Technical Symposiums (NITS) 2011 Highlights”

  1. Conyers says:

    Please teach the rest of these innteret hooligans how to write and research!

  2. Emberlynn says:

    Ab fab my gloody man.

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